Old Web
English
Sign In
Acemap
>
Paper
>
Analysis and Experimental Proof of Deterioration-free Memory Device Using CAAC-IGZO FET
Analysis and Experimental Proof of Deterioration-free Memory Device Using CAAC-IGZO FET
2015
Masashi Tsubuku
Toshihiko Takeuchi
Kazuaki Ohshima
Tsutomu Murakawa
Masashi Fujita
Daigo Shimada
S. Sambonsuge
Tomoaki Atsumi
Masayuki Sakakura
Kiyoshi Kato
Yoshitaka Yamamoto
Shunpei Yamazaki
Keywords:
Materials science
experimental proof
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
1
Citations
NaN
KQI
[]