Wandering and nanolaminated structures of grain boundary triple junctions in tungsten

Abstract The peculiarities of nanomorphology triple junctions have been studied by the method of field ion microscopy in fine-grained high-textured tungsten using the phenomenon of atom-by-atom field evaporation. It was found evidence of the formation of double-kinks at the triple junction lines accompanied by a local intrusion of several atomic layers of one grain into another. Observed a double-kink mode of the wandering is geometrically related to revealed nanolaminated structures of triple junctions bounded by pairs of twist boundaries. Molecular statics calculations have shown that the grain boundary expansion and energetics for the laminated grains with incommensurate twist grain boundaries are essentially independent of their thickness in nano-scale region.