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Publisher Correction: Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry
Publisher Correction: Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry
2018
James Keeley
Joshua R. Freeman
Karl Bertling
Yah Leng Lim
Reshma A. Mohandas
Thomas Taimre
Lianhe Li
Dragan Indjin
Aleksandar D. Rakic
E. H. Linfield
A. Giles Davies
Paul Dean
Keywords:
Laser
Semiconductor
Interferometry
Optics
Physics
Emission spectrum
Materials science
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