Suppression of glitches in X-ray measurements

Abstract There are two approaches in eliminating glitches that occur at particular X-ray monochromator energies due to coincidences of several reflections which take intensity from the main beam. The first is to move the monochromator crystals in such a manner as to avoid producing the glitches. This is very difficult in practice. The other approach is to make the I 0 and I detector systems very linear so as to cancel out the intensity changes and eliminate the glitch. We have used the latter approach at our laboratory EXAFS setup and at SSRL with a high degree of success. A discussion is presented on the elimination of nonlinearities in detector systems.