Some new Results on Strontium Bismuth Tantalate Thin-Film Ferroelectric Memory Materials

1996 
review is given, emphasizing electron microscopy, XPS, heavy-ion scattering, and very high frequency (1 MHz) hysteresis data, of the materials characteristics of thin films of SrBi2NbTaO9, SrBi2Ta2O9, and related titanates.
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