Some new Results on Strontium Bismuth Tantalate Thin-Film Ferroelectric Memory Materials
1996
review is given, emphasizing electron microscopy, XPS, heavy-ion scattering, and very high frequency (1 MHz) hysteresis data, of the materials characteristics of thin films of SrBi2NbTaO9, SrBi2Ta2O9, and related titanates.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
2
References
6
Citations
NaN
KQI