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X-ray Reflectivity and Total-Reflection Fluorescence Analysis of Amorphous SiO 2 /Ta 2 O 5 Thin Films
X-ray Reflectivity and Total-Reflection Fluorescence Analysis of Amorphous SiO 2 /Ta 2 O 5 Thin Films
2004
Wei Der Chang
Hsueh-Hsing Hung
Tang-Eh Dann
Tung-Wuu Huang
Shiou-Yun Wu
Keywords:
Total internal reflection
Fluorescence
Materials science
Amorphous solid
Thin film
Analytical chemistry
X-ray reflectivity
Correction
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