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Thickness Measurement of Ultra-thin TiO2 Films by Mutual Calibration Method
Thickness Measurement of Ultra-thin TiO2 Films by Mutual Calibration Method
2020
Ji Young Shin
Won-Ja Min
Hyo Sik Chang
and Kyung Joong Kim
Keywords:
Materials science
X-ray photoelectron spectroscopy
Transmission electron microscopy
Optoelectronics
Calibration
Correction
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