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Acemap > Paper > InGaN/GaN量子井戸構造の高励起キャリア密度再結合ダイナミクス:効率低下の可能な関連性

InGaN/GaN量子井戸構造の高励起キャリア密度再結合ダイナミクス:効率低下の可能な関連性

2013 
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