A method for adjusting the primary side of an X-ray diffractometer and related

A method for adjusting the primary side (2) of an X-ray diffractometer (1), wherein the primary side (2), a collimator (5), an X-ray optics (4) and an X-ray source (3), in particular an X-ray tube (15), wherein the collimator (5), X-ray optics (4) and the X-ray source (3) directly or indirectly on a base structure (12) are fixed, and wherein the orientation and position of the X-ray optics (4) and the position of the X-ray source (3) relative to the base structure (12) is to be adjusted, characterized, that the orientation and position of the X-ray optics (4) and the position of the X-ray source (3) relative to the base structure (12) are measured and adjusted to predetermined set points (206, 208) so that the output side of the collimator at the set target values ​​(5) from the X-ray source (3) and outgoing by the X-ray optics (4) conditioned x-ray radiation (6) is detected (211).