Magnetic field-induced charge transfer to a GaAs/(Ga,Al)As quantum well interface studied by C(e,A0i) photoluminescence

Abstract The photoluminescence (PL) from a 300 A GaAs((Ga,Al)As quantum well (QW) has been studied for a range of excitation powers, in magnetic fields up to 16 T applied both perpendicular to and in the plane of the QW. Particular attention was paid to the intensity of the (e,A 0 i ) transition due to Carbon acceptors located at one interface of the QW, in the presence of in-plane fields. The low power in-plane field dependence of the PL is a competition between two effects. At fields up to 12 T charge transfer is observed to and from the interface of the QW, resulting in an increase and subsequent decrease of the acceptor PL intensity. For field values exceeding 12 T the acceptor PL intensity is found to increase again. Whereas the first effect is well described by a composite oscillator model, the latter is suggested to be due to the decreased efficiency of electronic traps, located at the QW interface, for in-plane magnetic fields. These suggestions are confirmed by the excitation power dependence of the PL intensity for in-plane fields.