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Concentration Measurement In Free-Standing InGaN Nano-Islands With Transmission Electron Microscopy
Concentration Measurement In Free-Standing InGaN Nano-Islands With Transmission Electron Microscopy
2007
A. Pretorius
Knut Müller
Roland Kröger
D. Hommel
A. Rosenauer
T. Yamaguchi
Keywords:
Scanning confocal electron microscopy
Conventional transmission electron microscope
Analytical chemistry
Energy filtered transmission electron microscopy
Scanning transmission electron microscopy
Transmission electron microscopy
Materials science
Nano-
Optoelectronics
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