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Test of the Leakage Current and the Junction Capacitance for CdZnTe Semiconductor Detector
Test of the Leakage Current and the Junction Capacitance for CdZnTe Semiconductor Detector
2016
Li Yuandong
Zeng Guoqiang
Ge Liangquan
Tan Chengjun
Xu Yadong
Keywords:
Diffusion capacitance
Leakage (electronics)
Semiconductor detector
Electrical engineering
Engineering
Science, technology and society
Imagination
Chemical substance
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