Resolution Improvement in Beam Profile Measurements with Synchrotron Light

A numerical method for improving optical resolution in electron beam profile measurements with visible synchrotron radiation (SR) is proposed. Image formation of electron beam profile is described by integral convolution type equation of the first kind-the diagnostic equation. The precise procedure of computing the equation kernel in terms of classical electrodynamics is presented. With this procedure special features of the SR emission and diffraction scheme peculiarities may be taken into account. The numerical regularized solution of the diagnostic equation is shown to lead to the resolution improvement. The technique is supposed to be beneficial in high-energy storage rings. >