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Measurement of Radiation Damage on a Back-illuminated Silicon PIN Photodiode Caused by a 35 MeV Proton Beam
Measurement of Radiation Damage on a Back-illuminated Silicon PIN Photodiode Caused by a 35 MeV Proton Beam
2011
Jae Beom Bae
Hyo Jung Hyun
Dong Ha Kah
Hyun Ok Kim
Hwanbae Park
Myung Hwan Jung
Se-Jin Ra
Keywords:
Physics
Photodiode
Nuclear magnetic resonance
Proton
Radiation damage
Beam (structure)
Silicon
Condensed matter physics
Optics
Correction
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