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Investigation of the Band Alignment at h-BN/SiX Dielectric Interfaces utilizing X-ray Photoemission
Investigation of the Band Alignment at h-BN/SiX Dielectric Interfaces utilizing X-ray Photoemission
2014
Marc French
Sean King
Jeff Bielefeld
Joe Otto
Michelle M. Paquette
Anthon Caruso
Keywords:
Angle-resolved photoemission spectroscopy
Nuclear magnetic resonance
Dielectric
X-ray
Materials science
Optoelectronics
x ray photoemission
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