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New Findings on Hot-Carrier Stress in Large Grain Excimer Annealed N-Channel Polysilicon TFTs
New Findings on Hot-Carrier Stress in Large Grain Excimer Annealed N-Channel Polysilicon TFTs
1999
Farmakis
Brini
Kamarinos
Angelis
Dimitriadis
Miyasaka
Keywords:
n channel
Optoelectronics
hot carrier stress
Excimer
Materials science
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