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24pCF-6 Gated four-probe measurements in field-effect transistors of C_8-BTBT
24pCF-6 Gated four-probe measurements in field-effect transistors of C_8-BTBT
2012
Y Yamada
M Kozuka
T. Nozaki
Hiroshi Ito
Shun-ichiro Watanabe
Hisaaki Tanaka
Shin-ichi Kuroda
Kazuo Takimiya
Keywords:
Field-effect transistor
Nuclear magnetic resonance
Materials science
Optoelectronics
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