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Measuring Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diod e
Measuring Temperature Dependence of Critical Cracking Strain of Thin Films for Organic Light Emitting Diod e
2017
Toshiro Kobayashi
Munkhzul Munkhtsog
Yuichi Utumi
Hideyuki Kanematsu
Tsuyoshi Masuda
Keywords:
Tensile testing
Temperature measurement
Thin film
Optoelectronics
Composite material
Materials science
Strain (chemistry)
Cracking
OLED
Correction
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