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Fabrication and characterization of dopant nanowires in silicon
Fabrication and characterization of dopant nanowires in silicon
2003
J. S. Kline
K.F. Chen
R. Chan
M. Feng
J R. Tucker
A. Zudov
Rui-Rui Du
Jeong-Young Ji
J.C. Kim
T. C. Shen
Keywords:
Nanotechnology
Scanning tunneling microscope
Dopant
Nanowire
Materials science
Silicon
Fabrication
Correction
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