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Microwave characterisation of 1 micron-gate Al(0.48)In(0.52)As/Ga(0.47)In(0.53)As/InP MODFETs
Microwave characterisation of 1 micron-gate Al(0.48)In(0.52)As/Ga(0.47)In(0.53)As/InP MODFETs
1987
L. F. Palmateer
Paul J. Tasker
T. Itoh
April S. Brown
G. W. Wicks
Keywords:
Transconductance
Optoelectronics
Micrometre
Equivalent circuit
Materials science
Current density
Microwave
Correction
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