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Characterization of Glow Discharge α-Si: H Films by Time-of-Flight Measurement
Characterization of Glow Discharge α-Si: H Films by Time-of-Flight Measurement
1988
Junji Shirafuji
Reiji Hattori
Kazuhiro Shirakawa
Keywords:
Control engineering
Engineering
Glow discharge
Analytical chemistry
Time of flight
Optoelectronics
Control theory
Correction
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