Likelihood-sampling adaptive fault simulation
2017
This paper builds upon recent developments that argue for a fault simulation based on defect-likelihood sampling. It first questions, with a number of synthetic experiments, the premises of this approach and offers an alternative simple mechanism for the random selection of defects. Then, it introduces a new layer of variability with the parametrization of the opens and shorts resistivity while keeping the computational cost overhead low by means of an adaptive strategy.
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