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Characteristic control of nonvolatile pn memory diodes with SiC x O y or SiO x as electron trap layer
Characteristic control of nonvolatile pn memory diodes with SiC x O y or SiO x as electron trap layer
2017
Misa Tsuchiya
Takahiro Tsukamoto
Itaru Kato
Akihiro Saiga
Yoshiyuki Suda
Keywords:
Penning trap
Resistive random-access memory
Nanotechnology
Analytical chemistry
Materials science
Diode
Optoelectronics
cross point
Correction
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