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FCOB: packaging issues for RF-MEMS applications and reliability study
FCOB: packaging issues for RF-MEMS applications and reliability study
2005
Serguei Stoukatch
Tomas Webers
C. Winters
Petar Ratchev
De Wolf Ingrid
Baert Kris
Eric Beyne
Yoichi Oya
Akihiko Okubora
Keywords:
Electronic engineering
Microelectromechanical systems
Materials science
Reliability engineering
Computer science
reliability study
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