A novel method for mapping open-circuit voltage in solar cells with nanoscale resolution (Presentation Recording)

The electrical characteristics of thin-film compound semiconductor solar cells have been successfully probed by scanning probe microscopy. Nevertheless, a direct relationship between the measured signals and the figures of merit that define the device performance is still missing. Here we present a novel method to image and spatially resolve the Voc of solar cells with truly nanoscale resolution ( 200 mV. [1] E.M. Tennyson et al., Nature Commun., in review; [2] M.S. Leite et al., ACS Nano. 11, 11883 (2014).