In-situ Zugversuche an einkristallinen Gold-Nanodrähten im TEM
2012
The investigation of size dependent
mechanical properties of different materials was of great interest
for physicists over the past decades. Whereas the deformation of
bulk materials is nearly completely understood and the underlying
mechanisms are well known the situation for metals at the nano
scale is different and still under discussion. Therefore, in this
work the deformation of 40 – 250 nm thick, defect free, and single
crystalline gold nanowires was investigated directly in the
transmission electron microscope (TEM). These samples provide an
ideal model system for such studies because one can eliminate the
influence of the microstructure on deformation. In this work it was
shown, that stacking faults appear during deformation as the result
of the activation of partial dislocations. They nucleate
homogenously along the wire length. Twins can be formed through the
activation of partial dislocations on neighboring {111} planes.
Both deformation mechanisms could be directly observed in TEM. An
explanation for the findings is given with a model which describes
the nucleation process of dislocations on the atomic scale. The
model allows a quantitative estimation of the probability for each
process to occur in the experiment and the corresponding stresses
needed.
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