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Radiation effect and degradation mechanism in 65 nm CMOS transistor
Radiation effect and degradation mechanism in 65 nm CMOS transistor
2018
Ma Wu-Ying
Yao Zhibin
He Bao-ping
Wang Zujun
Liu Minbo
Liu Jing
Sheng Jiangkun
Dong Guan-tao
Xue Yuan-yuan
Keywords:
Materials science
Optoelectronics
CMOS
Degradation (geology)
Radiation effect
Correction
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