Optimization of 90nm Split Gate Nanocrystal Non-Volatile Memory

2007 
A 90 nm split gate nanocrystal bitcell has been demonstrated with scaled select gate oxide and adjustable control gate threshold voltage that allows for fast, low power SSI operation and top erase. This bitcell performance is excellent and holds promise for embedded flash applications.
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    0
    References
    1
    Citations
    NaN
    KQI
    []