Estimation method for channel characteristic of nonvolatile memory device

The present technology relates to a method for estimating the channel characteristic of a nonvolatile memory device. According to an aspect of the present invention, the input data of the nonvolatile memory device, on which a user wants to analyze, is reconstituted by considering the physical structure, the nonvolatile memory device. A mask including cells neighboring with a damaged cell is established based on the reconstituted data. The output data is grouped through the established mask. A lookup table is constructed using an arithmetical mean method or a RAM training technology. Interference is analyzed by the neighboring cells, and the output distribution of the damaged cell is constructed based on the lookup table. In addition, The distribution based on the interference of the neighboring cells can be estimated respectively by executing an algorithm by converting the shape of the mask into the various shapes. Meanwhile, Noise is analyzed by shifting the output data as the average value.