Single event transient pulsewidth measurements using a variable temporal latch technique

A new test structure was designed for measuring the pulsewidths of transients created by SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84MeV-cm/sup 2//mg. The pulsewidths of SETs generated using heavy ions are measured using a variable temporal latch. Our SET's widths at low LETs agree exceptionally well with previous localized beam measurements.