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High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT’s
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT’s
2003
J. Kuchenbecker
M. Borgarino
M. Zeuner
U. Konig
Robert Plana
F. Fantini
Keywords:
Electronic engineering
Engineering
Electric field
High-electron-mobility transistor
Degradation (geology)
Correction
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