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Investigation of the Robust Edge Termination Applied to 6.5kV SiC MOSFET
Investigation of the Robust Edge Termination Applied to 6.5kV SiC MOSFET
2018
Kohei Ebihara
Koutarou Kawahara
Shiro Hino
Koji Sadamatsu
Akemi Nagae
Yukiyasu Nakao
Hiroshi Watanabe
Satoshi Yamakawa
Keywords:
MOSFET
Composite material
Materials science
Engineering physics
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