The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation

I. I. Shvetsov-Shilovskiy,Alexander I. Chumakov,Alexander A. Pechenkin,D.V. Bobrovskiy

The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation

2021

I. I. Shvetsov-Shilovskiy
Alexander I. Chumakov
Alexander A. Pechenkin
D.V. Bobrovskiy

The paper concerns experimental results on external conditions such as temperature, voltage supply, current limit, and features of the power circuit on latchup occurrence under uniform laser irradiation.

Keywords:

Irradiation
Optoelectronics
random access memory
CMOS
Capacitor
Power (physics)
Laser
Integrated circuit
Voltage
Materials science

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