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HOW LOW CAN YOU GO? DETECTING TRACE ELEMENTS IN NATURAL QUARTZ CRYSTALS BY SECONDARY ION MASS SPECTROMETRY (SIMS)
HOW LOW CAN YOU GO? DETECTING TRACE ELEMENTS IN NATURAL QUARTZ CRYSTALS BY SECONDARY ION MASS SPECTROMETRY (SIMS)
2016
Richard L. Hervig
S. Branscomb
Margo E. Regier
Keywords:
Secondary ion mass spectrometry
Crystal
Static secondary-ion mass spectrometry
Quartz
Analytical chemistry
Chemistry
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