Photoinduced effects in thin films of Te20As30Se50 glass with nonlinear characterization

We discuss the influence of photoinduced effects (PIEs) on the measurements of nonlinear refractive indices and nonlinear absorption coefficients. A chalcogenide glass film Te20As30Se50 was studied using picosecond laser pulses at 1064 nm. The nonlinear imaging technique with phase object (NIT-PO) and the Z-scan technique were applied and their results are compared. The NIT-PO technique reveals clearly the influence of PIE on the samples’ response, while by using the Z-scan technique we measured the deepness of ablated regions (holes) produced during the measurements.