Secondary electron emission from a charged spherical dust particle due to electron incidence according to OML model

Abstract Effect of secondary electron emission (SEE) current to dust charging and influence to forces on a dust particle are studied according to the orbital motion limited (OML) model. As higher electron temperature increases the SEE current, the negative dust charge decreases. As a result, the ion friction force on the dust particle decreases. The critical electron temperatures without the dust charge are 75.1, 70.3 and 55.9 eV for graphite and are 31.3, 30.4 and 27.1 eV for tungsten to the temperature ratio T i / T e = 0.1, 1.0 and 10.0, respectively. At the critical electron temperature, there is no ion scattering force but the ion absorption force remains finite.