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Analysis and Research on Jittering H-line Failure of Cost-down IC Driven GOA Panel In High Temperature Reliability Test
Analysis and Research on Jittering H-line Failure of Cost-down IC Driven GOA Panel In High Temperature Reliability Test
2020
Song Yong
Guo Lei
Zhang JiaLi
Zhang Zhengxin
Yu Hongjun
Xue Hailin
Keywords:
Reliability engineering
Reliability (semiconductor)
Computer science
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