Lu3Al5O12-based materials for high 2D-resolution scintillation detectors

About 20 μm thick Ce-doped Lu 3 Al 5 O 12 thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to μm 2D-resolution. Their scintillation response is also measured under α-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets.