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Annealing of heavy-ion induced floating gate errors: LET and feature size dependence
Annealing of heavy-ion induced floating gate errors: LET and feature size dependence
2009
Bagatin
Gérardin
Cellere
Paccagnella
Visconti
Beltrami
Bonanomi
Harboe-Sorensen
Keywords:
Feature (computer vision)
Temperature measurement
heavy ion
annealing
size dependence
Ion
Materials science
Molecular physics
Correction
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