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Optical characterization of MBE grown cubic and hexagonal SiC films on Si(111) 1 Paper presented at
Optical characterization of MBE grown cubic and hexagonal SiC films on Si(111) 1 Paper presented at
1998
T. Werninghaus
Maria T. Friedrich
V. Cimalla
J. Scheiner
R. Goldhahn
D. R. T. Zahn
Jörg Pezoldt
Keywords:
Instrumental chemistry
Raman spectroscopy
Analytical chemistry
Hexagonal crystal system
Materials science
Polymer characterization
Molecular beam epitaxy
Atomic force microscopy
Silicon carbide
Crystallography
X-ray spectroscopy
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