Deterministic IDDQ diagnosis using a net activation based model

In Automotive business, the quiescent supply current test (IDDQ) is a widely used and valuable test method to screen out production failures and reach the required low defective parts per million (DPPM) quality targets. Automatic Test Pattern Generation (ATPG) tools can generate scan based IDDQ patterns with high test coverage for Pseudo Stuck-At (PSA) faults. Functional pass but IDDQ failing devices need to be diagnosed for various purposes. In this paper a fast simulation based method is proposed to diagnose IDDQ failures with single or multiple defects for digital circuitry. The results are verified on real silicon for several 130nm Automotive designs. Furthermore automation of the diagnosis method for high volume diagnosis similar to scan volume diagnosis is shown in the paper outlook.