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Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
2020
Akinobu Niozu
Y Kumagai
Toshiyuki Nishiyama
Hironobu Fukuzawa
Koji Motomura
Maximilian Bucher
Yuta Ito
Tsukasa Takanashi
Kazuki Asa
Yuhiro Sato
Daehyun You
Yiwen Li
Taishi Ono
Edwin Kukk
Catalin Miron
Liviu Neagu
Carlo Callegari
M. Di Fraia
Giorgio Rossi
Davide Emilio Galli
Tommaso Pincelli
Alessandro Colombo
Takashi Kameshima
Yasumasa Joti
T. Hatsui
Shigeki Owada
Tetsuo Katayama
Tadashi Togashi
Kensuke Tono
Makina Yabashi
Kazuhiro Matsuda
Christoph Bostedt
Kiyonobu Nagaya
Kiyoshi Ueda
Keywords:
single shot
Molecular physics
Crystal
Materials science
Diffraction
Nanoparticle
Correction
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