Lifetime prediction for components with scarce data: The “worst case” approach

A method for estimating the lifetime of the electronic components when scarce data are available is presented. Based on the “worst case” approach, the method also uses information obtained by failure analysis, as the necessary element for an accurate estimation of the reliability level. The method is useful for highly reliable modern components. In this paper, an example of using this method is given, focused on MEMS accelerometers.