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Deactivation Phenomenon for 0.18um Technology Indium Channel NMOS Devices
Deactivation Phenomenon for 0.18um Technology Indium Channel NMOS Devices
2000
Helmut Puchner
Sheldon Aronowitz
Vladimir Zubkov
Keywords:
Materials science
Boron
NMOS logic
Electronic engineering
Analytical chemistry
Doping
Indium
CMOS
Threshold voltage
Silicon
Phenomenon
Impurity
Correction
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