Early Time Dynamics of Laser-Ablated Silicon Using Ultrafast Grazing Incidence X-ray Scattering

Abstract Controlling the morphology of laser-derived nanomaterials is dependent on developing a better understanding of the particle nucleation dynamics in the ablation plume. Here, we utilize the femtosecond-length pulses from an x-ray free electron laser to perform time-resolved grazing incidence x-ray scattering measurements on a laser-produced silicon plasma plume. At 20 ps we observe a dramatic increase in the scattering amplitude at small scattering vectors, which we attribute to incipient formation of liquid silicon droplets. These results demonstrate the utility of XFELs as a tool for characterizing the formation dynamics of nanomaterials in laser-produced plasma plumes on ultrafast timescales.