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Managing Bias Leakage Currents and High Data Rates in the BABAR Silicon Vertex Tracker
Managing Bias Leakage Currents and High Data Rates in the BABAR Silicon Vertex Tracker
2008
J. Garra Tico
Valerio Re
M Bondioli
M. Bruinsma
S. Curry
D. Kirkby
Stephen Burke
D. Callahan
C. Campagnari
A Cunha
Daniel E. Hale
S. Kyre
J. D. Richman
Tw Beck
Am Eisner
J Kroseberg
W. S. Lockman
G Nesom
A Seiden
P Spradlin
L. O. Winstrom
D.A. Brown
S Dardin
F. Goozen
L.T. Kerth
G. Lynch
Na Roe
J. Anderson
C. Chen
Ck Lae
D. A. Roberts
G. Simi
J. M. Tuggle
A. Lazzaro
V. P. Lombardo
F. Palombo
Lodovico Ratti
Corrado Angelini
G. Batignani
S. Bettarini
F. Bosi
F. Bucci
Giovanni Calderini
M. Carpinelli
M. Ceccanti
R. Cenci
Alberto Cervelli
F Forti
M. A. Giorgi
A. Lusiani
P. Mammini
Pf Manfredi
Giovanni Marchiori
Ma Mazur
M. Morganti
Fabio Morsani
N. Neri
E. Paoloni
A. Profeti
M. Rama
G. Rizzo
John Walsh
P. Elmer
O. Long
E Charles
A. Perazzo
Pr Burchat
Aj Edwards
Ts Miyashita
Sa Majewski
B. A. Petersen
M. Bona
F. Bianchi
D. Gamba
P P Trapani
M Bomben
L. Bosisio
C. Cartaro
S. Dittongo
L Lanceri
L Vitale
V. Azzolini
N. Lopez-March
Yy Gao
Andrei Gritsan
Zj Guo
Keywords:
Vertex (geometry)
Leakage (electronics)
Integrated circuit
Electronic engineering
Data acquisition
Computer science
Silicon
Correction
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