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Low energy X ray induced degradation on background noise of MOS transistors
Low energy X ray induced degradation on background noise of MOS transistors
1989
A. Boukabache
G. Blasquez
Patrick Pons
Keywords:
Background noise
Annealing (metallurgy)
Noise (radio)
Semiconductor device
Transistor
Optoelectronics
Electromagnetic radiation
Materials science
degradation
X-ray
Correction
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