A production-oriented measurement method for fast and exhaustive Iddq tests

The paper describes a measurement method to perform an iddq test on each vector of a test pattern. The measurement is performed using the functional test mode of a digital tester. Vector rates between 100 KHz and 10 MHz yield a current resolution of 10 uA to 100 uA. The great advantage of the method is that the measurements are performed by using only the tester's pin electronic and the existing control software. No additional equipment is neccessary and the setup of the loadboard is made without any additional components except a buffering capacitance for the device, if needed. The application of the method to the iddq test of an 8 bit microcontroller is described.