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Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy
Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy
2020
Petr Klapetek
Andrew Yacoot
Václav Hortvík
Václav Duchoň
Herve Dongmo
Šimon Řeřucha
Miroslav Valtr
David Nečas
Keywords:
Atomic force microscopy
Physics
Optics
Fiber
Interferometry
Correction
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