The influence of surface roughness on the presence of polymorphs and defect states in P3HT layers

Abstract Despite extensive studies on the archetypal poly(3-hexylthiophene-2,5-diyl) (P3HT) over the past decade, a concurrent investigation of the surface roughness influence on polymorphism, density of states (DOS), photoluminescence (PL), and hole mobility is missing. We report on the effect of substrate roughness on the optical and electrical properties of P3HT thin films deposited on smooth c-Si (roughness